Vol. 62 | no. 2 | April - June 2014 Article 5

Grand Challenges and Relevant Failure Mechanisms of Nanoelectronic Devices
(full text in English)

Titu-Marius I. BĂJENESCU
Abstract
MEMS and NEMS applications under development today encompass the fields of automotive spacecraft components in the form of sensors and actuators, military applications, biomedical applications, etc. As we step into deep nanometre arena, major reliability issues arise; it becomes imperative to critically review the issues that the new age has brought with itself. The operation of those materials is critical for the success of the mission, and oft unreliable. Understanding their behaviour is important for further development of more complicated and multi-functional micro- and nanosystems. The process of changing one thing at a time, while holding everything else constant, has served the microelectronics industry very well, and it is not likely to be abandoned.
Keywords: nanoelectronic architecture, new memory technologies, faults, manufacturing defects, downscaling, fault mechanisms, unreliability

 

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